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Non-Destructive Testing
Film Thickness Gauge (CH-1-S)
MICROCREModel CH-1-S

Film Thickness Gauge (CH-1-S)

Updated 2026-11-12Category Non-Destructive Testing
Range0–1mm
ModelCH-1-S
CategoryNon-Destructive Testing
CustomizationCustom builds supported
400-8127-833 Generate proposal
Genuine Product
Nationwide Shipping
1-Year Warranty
VAT Invoice Available

Overview

No translation available yet — Chinese original below Full description (Chinese original) ↓

Page summary:Film Thickness Gauge (CH-1-S) is a Non-Destructive Testing product (model CH-1-S), manufactured by Shanghai Microcre Optics-Mech Tech Co., Ltd. Key specifications: Range = 0 -1mm; 上测头曲率半径 = 15 -50mm; 测头对试样施加负荷我 = 0.1-0.5N; Measuring accuracy = 100vm 以内< 1vm 100-250vm < 2vm 250vm < 3vm. Contact: 400-8127-833 / shanghai@yr17.net.
For detailed datasheets in English, please contact our sales engineers.

CH-1-S Specifications

Measuring capability1

What it can measure — the first thing to check against your samples

Range
0 – 1mm

Accuracy & resolution1

Error, repeatability and smallest reading — whether data can be used for acceptance

Measuring accuracy
100vm 以内< 1vm 100-250vm < 2vm 250vm < 3vm

Structure & travel1

Stage, travel, dimensions and weight — siting and fixturing

测头对试样施加负荷我
0.1 – 0.5N

Other1

Additional notes

上测头曲率半径
15 – 50mm

Specifications vary with configuration — confirm the final technical agreement with our engineer. Optional items are priced separately.

Range0 -1mm
上测头曲率半径15 -50mm
测头对试样施加负荷我0.1-0.5N
Measuring accuracy100vm 以内< 1vm 100-250vm < 2vm 250vm < 3vm

Some specification values are given in the original Chinese wording; ask our engineers for an English datasheet.

Full description (Chinese original)

The English text on this page summarises the model and specifications. The full technical description is the Chinese original below; an English datasheet is available from our engineers on request.

MC022 系列薄膜测厚仪
MC022 系列 (CH-1-S)
一、 CH-1-S 型薄膜测厚仪概述 :
CH-1-S 型薄膜测厚仪适用于机械测量法测定塑料薄膜和薄片的厚度(不适用于压花的薄膜和薄片)。本测厚仪执行 GB-T6672-2001 标准。
二、 CH-1-S 型薄膜测厚仪主要参数 :
1. 量程: 0 -1mm  分度值: 0.001mm
2. 上测头曲率半径: 15 -50mm
3. 测头对试样施加负荷我: 0.1-0.5N
4. 测量精度: 100vm 以内< 1vm
100-250vm < 2vm
250vm < 3vm

Selection FAQ

Can the configuration of CH-1-S be adapted to my application?

Yes. Beyond the standard configuration, measuring range, fixtures, optics and software functions can be adapted. Send your sample and test requirements and our engineers will return a configuration list and quotation.

Can I test my samples before ordering?

Yes. Samples can be mailed to our Shanghai Fengxian laboratory for free testing with a written report, or you can book an on-site demonstration to confirm the workflow and data format.

How are lead time, installation and after-sales service handled?

Standard configurations usually ship within 15-30 working days, including first installation, commissioning and operator training. The instrument carries a one-year warranty and software upgrades are free for life.

General information only — final configuration and applicable conditions are subject to the mutually confirmed technical document.

After-Sale & Selection Support

Sample Testing

  • Free testing of mailed samples
  • Factory demo by appointment
  • Written test proposal provided

Delivery & Training

  • Free first installation & commissioning
  • On-site operation training
  • One-year full warranty

Custom Builds

  • Fixtures, ranges and software customizable
  • Automation line integration
  • Lifetime free software upgrades
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